Dispersion of refractive index in thin films CdI2 and ZnI2

dc.contributor.authorYunakova, O.N.
dc.contributor.authorMiloslavsky, V.K.
dc.contributor.authorKovalenko, E.N.
dc.date.accessioned2012-11-28T11:40:45Z
dc.date.available2012-11-28T11:40:45Z
dc.date.issued2010
dc.description.abstractThe refractive index dispersion in thin CdI2 and ZnI2 films has been measured in the wavelength interval 300-1000 nm and processed using the monooscillator model ageeing well with experimental data. The optical permittivity e_unlim of both compounds has been determined using the found parameters of this model, the optical permittivity data have been used in the further analysis of exciton states in CdI2 and ZnI2, in particular, for determination of 1s exciton radius. The found a_ex values are close to the unit cell parameters of the compounds, thus indicating that the excitons in two compounds belong to excitons of the intermediate electron-hole band.en
dc.identifier.citationFunct. Mater., 2010, Vol. 17, № 3, pp.228-293.en
dc.identifier.issn1027-5495
dc.identifier.urihttps://ekhnuir.karazin.ua/handle/123456789/7109
dc.language.isoenen
dc.publisherInstitute for Single Crystalsen
dc.subjectоптикаen
dc.subjectкафедра физической оптикиen
dc.subjectCdI2en
dc.subjectZnI2en
dc.subjectпоказатель преломленияen
dc.subjectмодель Вемплаen
dc.subjectэффективная диэлектрическая проницаемостьen
dc.subjectэкситонen
dc.titleDispersion of refractive index in thin films CdI2 and ZnI2en
dc.typeArticleen

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